In a Korean-language post on X, the embassy warned applicants that even minor legal infractions or providing false information could lead to visa denial or a permanent ban from entering the United States.
"When applying for a U.S. visa or completing an Electronic System for Travel Authorization (ESTA) application, honesty is the best policy," it stated.
It noted that consular officers rigorously review applicants' criminal histories, including past violations or arrests, emphasizing that even a minor offense on your record can lead to visa refusal, or even a permanent ban from entering the United States.
"Being honest (about past violations) does not always mean your visa will be denied, but providing false information can result in a permanent ban from entering the United States. Therefore, always answer questions factually when filling out your application and during your interview," said the embassy.
Previously in a post from April 14, the embassy advised applicants to strictly adhere to the terms of their stay in the U.S.
"Did you know that if you exceed your authorized period of stay in the U.S. even once, you could be permanently barred from traveling there, or—despite having once qualified for the Visa Waiver Program—find it difficult to obtain a visa in the future?"
Consular officers and immigration authorities can verify any overstay of one's permitted period, it warned, and advised that "it is your responsibility to comply with the regulations."
These messages align with the Trump administration's ongoing strict immigration policies.
On March 18, the U.S. State Department announced on its Facebook and X accounts that U.S. visa screening does not stop after a visa is issued.
"We continuously check visa holders to ensure they follow all U.S. laws and immigration rules – and we will revoke their visas and deport them if they don't," it said.
The administration has been intensifying its enforcement efforts by canceling visas of many legally admitted foreign students, reinforcing its tough stance on immigration.